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Frequency Response Analysis Method for Transformer Winding Deformation Tester

Frequency Response Analysis Method for Transformer Winding Deformation Tester

Product Details:
Place of Origin: Xi'an, Shaanxi, China
Brand Name: XZH TEST
Certification: CE, ISO
Model Number: XHBX1501
Detail Information
Place of Origin:
Xi'an, Shaanxi, China
Brand Name:
XZH TEST
Certification:
CE, ISO
Model Number:
XHBX1501
Model NO.:
XHBX1501
Power:
Electricity
Customized:
Customized
Amplitude Measurement Range:
(-120dB) To (+20 DB)
Amplitude Measurement Accuracy:
0.1dB
Scanning Frequency Accuracy:
0.005%
Customization:
Available
Warranty:
1 Year
Trading Information
Minimum Order Quantity:
1 unit
Packaging Details:
wooden case
Delivery Time:
5-8 days
Payment Terms:
T/T
Supply Ability:
1000 PCS/Year
Product Description


Xzh Test Frequency Response Analysis Method for Transformer Winding Deformation Tester

Transformer winding deformation tester based can make accurate diagnosis on the transformer internal fault based on the measurement of the characteristic parameters of transformer windings inside, using the frequency response analysis (FRA) method developed and improved by the developed countries
Product Parameters



Amplitude measurement range (-120dB) to (+20 dB)
Amplitude measurement accuracy 0.1dB
Signal input impedance: 1MΩ
Signal output impedance 50Ω
Signal output amplitude ± 20V
Test repetition percent 99.9%
Measuring instruments dimensions (LxWxH) 300X340X120 (mm)
Instrument's aluminum box size (LxWxH) 310X400X330 (mm)
Overall weight 13Kg
Operating temperature -10ºC to +40ºC
Storage temperature -20ºC to +70ºC
Relative humidity <90%, non-condensing


Main performance features

Acquisition and control using high-speed, highly integrated microprocessor.

Communication USB interface used between a laptop and instrument.

The communication between the laptop and the instrument can use wireless Bluetooth interface or wireless WIFI interface (optional)

The wireless WIFI interface can be conveniently used on tablet computers and smart phones.

Hardware adopts dedicated DDS digital high-speed scanning technology (USA), which can accurately diagnose the faults like winding distorted, bulged, shift, tilt, inter-turn short-circuit deformation and inter-phase contact short-circuit.

High-speed dual-channel 16-bit A/D sampling (in field test, move tap changer, and the wave curve shows obvious change) .

The signal output amplitude is adjusted by software, the maximum amplitude peak value is ±10V.

The computer will automatically analyze the test results and generate electronic documents (Word).

The instrument has dual measurement features: linear frequency scanning measurement and segment frequency scanning measurement, compatible with measurement mode of two technical groups in China.

The amplitude-frequency characteristics are in line with the national technical specifications on amplitude-frequency characteristics tester. X-coordinate (frequency) has linear indexing and logarithmic indexing, so you can print out the curve with linear indexing and logarithmic indexing. The user can choose either according to actual needs.

Automatic test data analysis system,